Dynamic characteristic test apparatus and dynamic characteristic test method

• Main Authors: SAKAMOTO, YOICHI, TAKITA, NOBUYUKI
• Format: Patent
• Language: Chinese; English
• Published: 01.12.2016
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

This dynamic characteristic test apparatus comprises: a power source; a reactor; a selection circuit that has first and second switching units electrically connected in series with each other, a third diode connected in parallel to the first switching unit, and a fourth diode connected in parallel to the second switching unit, and that is for selecting a first semiconductor or a second semiconductor as a subject for switching measurement; a third switching unit that switches between supplying current and stopping the supply from the power source to the first semiconductor or the second semiconductor; and a control device that controls switching between on states and off states of the switching units. A first connection part electrically connecting the first and second semiconductors with each other is electrically connected, via the reactor, to a second connection part electrically connecting the first and second switching units with each other. The control device turns on the second and third switching units