Laser etching system including mask reticle for multi-depth etching

A laser etching system includes a laser source configured to generate a plurality of laser pulses during an etching pass. A workpiece is aligned with respect to the laser source. The workpiece includes an etching material that is etched in response to receiving the plurality of laser pulses. A mask...

Full description

Saved in:
Bibliographic Details
Main Authors TESSLER, CHRISTOPHER L, POLOMOFF, NICHOLAS A, SOUTER, MATTHEW E, ERWIN, BRIAN M
Format Patent
LanguageChinese
English
Published 16.03.2016
Subjects
Online AccessGet full text

Cover

Loading…
Abstract A laser etching system includes a laser source configured to generate a plurality of laser pulses during an etching pass. A workpiece is aligned with respect to the laser source. The workpiece includes an etching material that is etched in response to receiving the plurality of laser pulses. A mask reticle is interposed between the laser source and the workpiece. The mask reticle includes at least one mask pattern configured to regulate the fluence or a number of laser pulses realized by the workpiece such that a plurality of features having different depths with respect to one another are etched in the etching material.
AbstractList A laser etching system includes a laser source configured to generate a plurality of laser pulses during an etching pass. A workpiece is aligned with respect to the laser source. The workpiece includes an etching material that is etched in response to receiving the plurality of laser pulses. A mask reticle is interposed between the laser source and the workpiece. The mask reticle includes at least one mask pattern configured to regulate the fluence or a number of laser pulses realized by the workpiece such that a plurality of features having different depths with respect to one another are etched in the etching material.
Author POLOMOFF, NICHOLAS A
SOUTER, MATTHEW E
TESSLER, CHRISTOPHER L
ERWIN, BRIAN M
Author_xml – fullname: TESSLER, CHRISTOPHER L
– fullname: POLOMOFF, NICHOLAS A
– fullname: SOUTER, MATTHEW E
– fullname: ERWIN, BRIAN M
BookMark eNrjYmDJy89L5WRw9kksTi1SSC1JzsjMS1coriwuSc1VyMxLzilNAQnkJhZnKxSllmQm56QqpOUXKeSW5pRk6qakFpRkwHTxMLCmJeYUp_JCaW4GRTfXEGcP3dSC_PjU4oLE5NS81JL4kHAjA0MzQ0NDMzNHY2LUAACn1DRx
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
ExternalDocumentID TW201611166A
GroupedDBID EVB
ID FETCH-epo_espacenet_TW201611166A3
IEDL.DBID EVB
IngestDate Fri Jul 19 16:41:08 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language Chinese
English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_TW201611166A3
Notes Application Number: TW20150130127
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160316&DB=EPODOC&CC=TW&NR=201611166A
ParticipantIDs epo_espacenet_TW201611166A
PublicationCentury 2000
PublicationDate 20160316
PublicationDateYYYYMMDD 2016-03-16
PublicationDate_xml – month: 03
  year: 2016
  text: 20160316
  day: 16
PublicationDecade 2010
PublicationYear 2016
RelatedCompanies INTERNATIONAL BUSINESS MACHINES CORPORATION
SUSS MICROTEC PHOTONIC SYSTEMS INC
RelatedCompanies_xml – name: SUSS MICROTEC PHOTONIC SYSTEMS INC
– name: INTERNATIONAL BUSINESS MACHINES CORPORATION
Score 3.1421285
Snippet A laser etching system includes a laser source configured to generate a plurality of laser pulses during an etching pass. A workpiece is aligned with respect...
SourceID epo
SourceType Open Access Repository
SubjectTerms BASIC ELECTRIC ELEMENTS
CLADDING OR PLATING BY SOLDERING OR WELDING
CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MACHINE TOOLS
METAL-WORKING NOT OTHERWISE PROVIDED FOR
PERFORMING OPERATIONS
SEMICONDUCTOR DEVICES
SOLDERING OR UNSOLDERING
TRANSPORTING
WELDING
WORKING BY LASER BEAM
Title Laser etching system including mask reticle for multi-depth etching
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160316&DB=EPODOC&locale=&CC=TW&NR=201611166A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwY2BQMTBPTEmzME7UTTWyNNU1MUmy0E0CtvJ1gZUfkE5MNDNNA-0d9vUz8wg18YowjWBiyILthQGfE1oOPhwRmKOSgfm9BFxeFyAGsVzAayuL9ZMygUL59m4hti5q0N4x-M5kMzUXJ1vXAH8Xf2c1Z2fbkHA1vyCwHDBbm5k5MjOwApvR5qDc4BrmBNqVUoBcpbgJMrAFAE3LKxFiYKrKEGbgdIbdvCbMwOELnfAGMqF5r1iEwdkHWOEUKYCCGVjdKECOYFbIzEvOKQXVPwq5icXZCuA9iTmpCsCmqAJ4raBuSmpBSQZMlyiDoptriLOHLtA18XCvx4eEIxxuLMbAkpeflyrBoGABamalWFqAejcmRgZJiQYWacmGSZapJhamScBOrSSDFG5zpPBJSjNwgTigVVaGZjIMLCVFpamywGq3JEkOHF4AoCaG-w
link.rule.ids 230,309,783,888,25576,76876
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwY2BQMTBPTEmzME7UTTWyNNU1MUmy0E0CtvJ1gZUfkE5MNDNNA-0d9vUz8wg18YowjWBiyILthQGfE1oOPhwRmKOSgfm9BFxeFyAGsVzAayuL9ZMygUL59m4hti5q0N4x-M5kMzUXJ1vXAH8Xf2c1Z2fbkHA1vyCwHDBbm5k5MjOwApvY5qDc4BrmBNqVUoBcpbgJMrAFAE3LKxFiYKrKEGbgdIbdvCbMwOELnfAGMqF5r1iEwdkHWOEUKYCCGVjdKECOYFbIzEvOKQXVPwq5icXZCuA9iTmpCsCmqAJ4raBuSmpBSQZMlyiDoptriLOHLtA18XCvx4eEIxxuLMbAkpeflyrBoGABamalWFqAejcmRgZJiQYWacmGSZapJhamScBOrSSDFG5zpPBJyjNweoT4-sT7ePp5SzNwgSRAK64MzWQYWEqKSlNlgVVwSZIcOOwAIG2J7g
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Laser+etching+system+including+mask+reticle+for+multi-depth+etching&rft.inventor=TESSLER%2C+CHRISTOPHER+L&rft.inventor=POLOMOFF%2C+NICHOLAS+A&rft.inventor=SOUTER%2C+MATTHEW+E&rft.inventor=ERWIN%2C+BRIAN+M&rft.date=2016-03-16&rft.externalDBID=A&rft.externalDocID=TW201611166A