Laser etching system including mask reticle for multi-depth etching
A laser etching system includes a laser source configured to generate a plurality of laser pulses during an etching pass. A workpiece is aligned with respect to the laser source. The workpiece includes an etching material that is etched in response to receiving the plurality of laser pulses. A mask...
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Main Authors | , , , |
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Format | Patent |
Language | Chinese English |
Published |
16.03.2016
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Subjects | |
Online Access | Get full text |
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Summary: | A laser etching system includes a laser source configured to generate a plurality of laser pulses during an etching pass. A workpiece is aligned with respect to the laser source. The workpiece includes an etching material that is etched in response to receiving the plurality of laser pulses. A mask reticle is interposed between the laser source and the workpiece. The mask reticle includes at least one mask pattern configured to regulate the fluence or a number of laser pulses realized by the workpiece such that a plurality of features having different depths with respect to one another are etched in the etching material. |
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Bibliography: | Application Number: TW20150130127 |