Laser etching system including mask reticle for multi-depth etching

A laser etching system includes a laser source configured to generate a plurality of laser pulses during an etching pass. A workpiece is aligned with respect to the laser source. The workpiece includes an etching material that is etched in response to receiving the plurality of laser pulses. A mask...

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Bibliographic Details
Main Authors TESSLER, CHRISTOPHER L, POLOMOFF, NICHOLAS A, SOUTER, MATTHEW E, ERWIN, BRIAN M
Format Patent
LanguageChinese
English
Published 16.03.2016
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Summary:A laser etching system includes a laser source configured to generate a plurality of laser pulses during an etching pass. A workpiece is aligned with respect to the laser source. The workpiece includes an etching material that is etched in response to receiving the plurality of laser pulses. A mask reticle is interposed between the laser source and the workpiece. The mask reticle includes at least one mask pattern configured to regulate the fluence or a number of laser pulses realized by the workpiece such that a plurality of features having different depths with respect to one another are etched in the etching material.
Bibliography:Application Number: TW20150130127