A thimble board testing system and a method thereof

• Main Authors: WANG, GIANT ZHENG-PING, YANG, SULLIVAN RUNANG, LIAO, NASH YIANG, ZHAO, ALEX JUN-JIE, WANG, I-AN, HUANG, JOEY ZHONG-YI
• Format: Patent
• Language: Chinese; English
• Published: 16.06.2015
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The present invention is related to a thimble board testing system and a method thereof, more particularly to a testing system and a method thereof that adopt a Gerber file to find out a plurality of correct connection positions of a plurality of test thimbles (test pins) of a test thimble board via an arbitrary electric connection. The thimble board testing system comprises: a test thimble board, which has a plurality of test thimbles that need to be tested by electric test; and a testing device, which has a transmission device, at least one connector, an analog digital converter (ADC). The test thimble board can be disposed in the testing device for electric test. The testing device stores a coordinate file, for example, a Gerber file, and the coordinate file has coordinate data of the test thimbles. The testing device is able to read the coordinate data as well. The transmission device is installed in the testing device and has a probe. The plurality of test thimbles can be arbitrarily and electrically con