Display method for user interface of semiconductor inspection system

Display method for user interface of semiconductor inspection system includes selecting an inspection function, classifying different thresholds required by the inspection function into different filtering groups according to their attributes, and displaying those filtering groups on the user interf...

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Bibliographic Details
Main Authors WU, CHAI-HSING, CHOU, MING-HAO, YANG, SHANG-YI
Format Patent
LanguageChinese
English
Published 16.11.2013
Subjects
ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
PHYSICS
SEMICONDUCTOR DEVICES
TARIFF METERING APPARATUS
TESTING
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Summary:Display method for user interface of semiconductor inspection system includes selecting an inspection function, classifying different thresholds required by the inspection function into different filtering groups according to their attributes, and displaying those filtering groups on the user interface and presenting relationships between those filtering groups by graphic methods.
Bibliography:Application Number: TW20120115972