Improved electrically conductive Kelvin contacts for microcircuit tester
Terminals (2, 502) of a device under test (DUT) are connected to corresponding contact pads or leads by a series of electrically conductive contacts. Each terminal testing connects with both a ''force'' contact and a ''sense'' contact. In one embodiment, the s...
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Main Authors | , , |
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Format | Patent |
Language | Chinese English |
Published |
01.05.2013
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Subjects | |
Online Access | Get full text |
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Summary: | Terminals (2, 502) of a device under test (DUT) are connected to corresponding contact pads or leads by a series of electrically conductive contacts. Each terminal testing connects with both a ''force'' contact and a ''sense'' contact. In one embodiment, the sense contact (770) partially or completely laterally surrounds the force contact (700). In order to increase the contact surface, the force contact, in a spring pin (700) configuration contacts the device under test terminal at that portion of the lead which is curved or angled, rather than orthogonal to the pin. |
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Bibliography: | Application Number: TW20110137922 |