Improved electrically conductive Kelvin contacts for microcircuit tester

Terminals (2, 502) of a device under test (DUT) are connected to corresponding contact pads or leads by a series of electrically conductive contacts. Each terminal testing connects with both a ''force'' contact and a ''sense'' contact. In one embodiment, the s...

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Bibliographic Details
Main Authors SHERRY, JEFFREY C, ERDMAN, JOEL N, MICHALKO, GARY W
Format Patent
LanguageChinese
English
Published 01.05.2013
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:Terminals (2, 502) of a device under test (DUT) are connected to corresponding contact pads or leads by a series of electrically conductive contacts. Each terminal testing connects with both a ''force'' contact and a ''sense'' contact. In one embodiment, the sense contact (770) partially or completely laterally surrounds the force contact (700). In order to increase the contact surface, the force contact, in a spring pin (700) configuration contacts the device under test terminal at that portion of the lead which is curved or angled, rather than orthogonal to the pin.
Bibliography:Application Number: TW20110137922