4-transistor non-volatile memory cell with PMOS-NMOS-PMOS-NMOS structure
A non-volatile memory (NVM) cell structure comprises a PMOS program transistor having source, drain and bulk region electrodes and a gate electrode that is connected to a data storage node; an NMOS control transistor having source, drain and bulk region electrodes that are commonly-connected to rece...
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Main Authors | , , , |
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Format | Patent |
Language | Chinese English |
Published |
01.12.2011
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Subjects | |
Online Access | Get full text |
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Summary: | A non-volatile memory (NVM) cell structure comprises a PMOS program transistor having source, drain and bulk region electrodes and a gate electrode that is connected to a data storage node; an NMOS control transistor having source, drain and bulk region electrodes that are commonly-connected to receive a control voltage and a gate electrode that is connected to the data storage node; a PMOS erase transistor having source, drain and bulk region electrodes that are commonly-connected to receive an erase voltage and a gate electrode that is connected to the data storage node; and an NMOS read transistor having source, drain and bulk region electrodes and a gate electrode connected to the data storage node. |
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Bibliography: | Application Number: TW20110107293 |