Semiconductor device contacting apparatus for test handler and test handler using the same

A semiconductor device contacting apparatus and a test handler using the same is disclosed, which facilitate a replacement of semiconductor device contacting apparatus when a semiconductor device to be tested is changed in its kind, thickness, or size, the semiconductor device contacting apparatus f...

Full description

Saved in:
Bibliographic Details
Main Author SHIN, BEOM-HO
Format Patent
LanguageChinese
English
Published 01.12.2010
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
Online AccessGet full text

Cover

More Information
Summary:A semiconductor device contacting apparatus and a test handler using the same is disclosed, which facilitate a replacement of semiconductor device contacting apparatus when a semiconductor device to be tested is changed in its kind, thickness, or size, the semiconductor device contacting apparatus for test handler comprising plural pushing units provided at fixed intervals on an operating plate, each plural pushing unit for bring a semiconductor device in contact with a test socket of a test board by pushing the semiconductor device according to an operation of the operating plate, wherein each of the plural pushing units comprises a pushing block having a head-inserting portion; a pushing head unit detachably inserted into the head-inserting portion; and plural block-supporting members for supporting the pushing block, the plural block-supporting members installed in the operating plate.
Bibliography:Application Number: TW201099112969