An ion beam guide tube
The present invention relates to ion implanters, and in particular to the guide tube for an ion beam in an ion implanter which is located in the implanter adjacent a semiconductor wafer being implanted. Such guide tubes are provided primarily to confine charged particles used for wafer neutralisatio...
Saved in:
Main Authors | , , , , , , |
---|---|
Format | Patent |
Language | Chinese English |
Published |
16.06.2009
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | The present invention relates to ion implanters, and in particular to the guide tube for an ion beam in an ion implanter which is located in the implanter adjacent a semiconductor wafer being implanted. Such guide tubes are provided primarily to confine charged particles used for wafer neutralisation during implantation. Advantageously, the guide tube has an outwardly tapering central bore thereby alleviating problems of beam strike as the ion beam passes through the guide tube. |
---|---|
Bibliography: | Application Number: TW20080138417 |