Diffuse illumination apparatus for inspection system

• Main Authors: WANG, CHUNIEH, TU, CHUNG-FAN, SHIH, YU-SEN
• Format: Patent
• Language: Chinese; English
• Published: 01.10.2008
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

A Diffuse illumination apparatus for inspection system is disclosed in the present invention, which comprises a concave reflector, a PTFE diffuse layer and at least one lighting device. The concave reflector has aperture disposed on the top thereof. The PTFE diffuse layer formed on the inner surface of the concave reflector. The at least one lighting device is disposed inside the concave reflector and each of the lighting device has a plurality of lighting element arranged thereon. By means of the PTFE disuse layer of the present invention, it is capable of diffusing light emitted from the lighting device uniformly. Meanwhile, the high power light emitting diodes are utilized to be the lighting element of the lighting device, which are capable of providing preferred light intensity. With the two characteristics aforesaid provided by the diffuse illumination apparatus disclosed in the present invention, a uniform diffusing light and higher intensity of illumination may be provided to solve the problem of insuf