Short-circuit test device for an armature

• Main Authors: LIN, JUN-TSUN, TSENG, CHYUAN-YOW, HUANG, YU-JEN, DING, YI-MING
• Format: Patent
• Language: Chinese; English
• Published: 01.07.2008
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

A short-circuit test device for an armature comprises a magnetic field excitation unit, a roller unit, a driving unit, and an induction unit. The magnetic field excitation unit produces an external magnetic field. The roller unit is assembled on the top end of the magnetic field excitation unit. The driving unit connects to an end of the roller unit so that the roller unit can be rotated when driving the driving unit. The induction unit provides a permeance member and an induced member. A tested armature is placed on the roller unit for receiving the external magnetic field. Furthermore, the tested armature rotates with the roller unit. Accordingly, when the tested armature occurs short-circuit, the tested armature will be produced an induced magnetic field. The permeance member can receive the induced magnetic field, and the induced member will convert the induced magnetic field into a electrical signal for detecting the short-circuit fault of the tested armature including the fault types and positions such