Insert, test tray and semiconductor test device
An insert is provided, which accommodates a tested semiconductor element 100 in a semiconductor test device. The insert includes a frame section 520, an IC reception section 530, a connection section and a guide section. The IC reception section 530 supports the tested semiconductor element 100. The...
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| Main Authors | , |
|---|---|
| Format | Patent |
| Language | Chinese English |
| Published |
16.08.2007
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| Subjects | |
| Online Access | Get full text |
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| Abstract | An insert is provided, which accommodates a tested semiconductor element 100 in a semiconductor test device. The insert includes a frame section 520, an IC reception section 530, a connection section and a guide section. The IC reception section 530 supports the tested semiconductor element 100. The connection section mutually connects the frame section 520 and the IC reception section 530 when their relative position is changed. The guide section, in a specified period, guides the IC reception section 530 to a relatively specified position relating to the frame section 520. |
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| AbstractList | An insert is provided, which accommodates a tested semiconductor element 100 in a semiconductor test device. The insert includes a frame section 520, an IC reception section 530, a connection section and a guide section. The IC reception section 530 supports the tested semiconductor element 100. The connection section mutually connects the frame section 520 and the IC reception section 530 when their relative position is changed. The guide section, in a specified period, guides the IC reception section 530 to a relatively specified position relating to the frame section 520. |
| Author | ITO, AKIHIKO SUGANO, SAYAKA |
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| Notes | Application Number: TW20060137073 |
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| PublicationDateYYYYMMDD | 2007-08-16 |
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| PublicationYear | 2007 |
| RelatedCompanies | ADVANTEST CORPORATION |
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| Snippet | An insert is provided, which accommodates a tested semiconductor element 100 in a semiconductor test device. The insert includes a frame section 520, an IC... |
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| SubjectTerms | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| Title | Insert, test tray and semiconductor test device |
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