Insert, test tray and semiconductor test device

An insert is provided, which accommodates a tested semiconductor element 100 in a semiconductor test device. The insert includes a frame section 520, an IC reception section 530, a connection section and a guide section. The IC reception section 530 supports the tested semiconductor element 100. The...

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Bibliographic Details
Main Authors SUGANO, SAYAKA, ITO, AKIHIKO
Format Patent
LanguageChinese
English
Published 16.08.2007
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:An insert is provided, which accommodates a tested semiconductor element 100 in a semiconductor test device. The insert includes a frame section 520, an IC reception section 530, a connection section and a guide section. The IC reception section 530 supports the tested semiconductor element 100. The connection section mutually connects the frame section 520 and the IC reception section 530 when their relative position is changed. The guide section, in a specified period, guides the IC reception section 530 to a relatively specified position relating to the frame section 520.
Bibliography:Application Number: TW20060137073