Wafer planarization composition and method of use

A wafer polishing solution and method for polishing a wafer comprising an amino acid and calcium ions or barium ions. The wafer polishing solution can be adjusted to control cut rate and selectivity for modifying semiconductor wafers using a fixed abrasive CMP process.

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Bibliographic Details
Main Authors RUEB, CHRISTOPHER JOHN, WEBB, RICHARD JAMES, VELAMAKANNI, BHASKAR V
Format Patent
LanguageChinese
English
Published 16.08.2006
Subjects
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Summary:A wafer polishing solution and method for polishing a wafer comprising an amino acid and calcium ions or barium ions. The wafer polishing solution can be adjusted to control cut rate and selectivity for modifying semiconductor wafers using a fixed abrasive CMP process.
Bibliography:Application Number: TW20050145645