Semiconductor device and semiconductor device manufacturing method

A technique is provided which enables formation of nitride semiconductor layers with excellent flatness and excellent crystallinity on a gallium nitride substrate (GaN substrate), while improving the producibility of the semiconductor device using the GaN substrate. A gallium nitride substrate is pr...

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Bibliographic Details
Main Authors TOMITA, NOBUYUKI, TAKEMI, MASAYOSHI, OHNO, AKIHITO
Format Patent
LanguageChinese
English
Published 01.06.2006
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Summary:A technique is provided which enables formation of nitride semiconductor layers with excellent flatness and excellent crystallinity on a gallium nitride substrate (GaN substrate), while improving the producibility of the semiconductor device using the GaN substrate. A gallium nitride substrate is prepared which has an upper surface having an off-angle of not less than 0.1 DEG nor more than 1.0 DEG in a <1-100> direction, with respect to a (0001) plane. Then, a plurality of nitride semiconductor layers including an n-type semiconductor layer are stacked on the upper surface of the gallium nitride substrate to form a semiconductor device such as a semiconductor laser.
Bibliography:Application Number: TW20050133333