Probe for testing a device under test

A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.

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Bibliographic Details
Main Authors ANDREWS, MIKE, MARTIN, JOHN, DUNKLEE, JOHN, LESHER, TIM, HAYDEN, LEONARD, SAFWAT, AMR M.E, GLEASON, K. REED, STRID, ERIC W
Format Patent
LanguageChinese
English
Published 16.02.2005
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
Bibliography:Application Number: TW20040114360