System and method of measuring low impedances

• Main Authors: HOUGHTON, CHRISTOPHER L, LAURENT, JAMES J. ST, KANTOROVICH, ISAAC
• Format: Patent
• Language: Chinese; English
• Published: 01.05.2004
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

A method (56) of measuring impedance in a system having a microprocessor (14) comprises holding the microprocessor (14) in reset mode and providing a clock to the microprocessor at a frequency FCLK (57, 58) while measuring a first current level, providing the clock at frequency FCLK/N (59, 60) while...