System and method of measuring low impedances

A method (56) of measuring impedance in a system having a microprocessor (14) comprises holding the microprocessor (14) in reset mode and providing a clock to the microprocessor at a frequency FCLK (57, 58) while measuring a first current level, providing the clock at frequency FCLK/N (59, 60) while...

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Bibliographic Details
Main Authors HOUGHTON, CHRISTOPHER L, LAURENT, JAMES J. ST, KANTOROVICH, ISAAC
Format Patent
LanguageChinese
English
Published 01.05.2004
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:A method (56) of measuring impedance in a system having a microprocessor (14) comprises holding the microprocessor (14) in reset mode and providing a clock to the microprocessor at a frequency FCLK (57, 58) while measuring a first current level, providing the clock at frequency FCLK/N (59, 60) while measuring a second current level, measuring the voltage at a plurality of ports in the system a plurality of times to obtain a plurality of sets of voltage measurements (61, 62, 63) while holding the microprocessor in reset mode, toggling the clock frequency between FCLK and FCLK/N, and generating a periodic current waveform. The plurality of sets of voltage measurements are averaged. The method further comprises varying FCLK and determining a Fourier component of the averaged voltage measurements to determine clock frequency-dependent noises, and removing the clock frequency-dependent noises to generate a filtered average voltage (64), and determining an impedance by dividing a Fourier component of the filtered a
Bibliography:Application Number: TW200392113583