DEVICE FOR MEASURING THICKNESS AND REFRACTION INDICES OF FILMS

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Bibliographic Details
Main Author SMIRNOV IGOR K,SU
Format Patent
LanguageEnglish
Russian
Published 15.06.1989
Subjects
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Bibliography:Application Number: SU19874302119