DEVICE FOR MEASURING REFLECTION RATIO

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Bibliographic Details
Main Authors EFIMOV VLADIMIR M,SU, SOBOL VALERIJ P,SU
Format Patent
LanguageEnglish
Russian
Published 15.11.1985
Edition4
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
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Bibliography:Application Number: SU19843758883