METHOD OF MEASURING AVALANCHE TRANSIT TIME DIODE THERMAL RESISTANCE

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Bibliographic Details
Main Authors GUDZ IVAN A,SU, YASINSKIJ VASILIJ K,SU
Format Patent
LanguageEnglish
Published 07.12.1984
Edition3
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Bibliography:Application Number: SU19833584532