SILICON ETCH WITH PASSIVATION USING PLASMA ENHANCED OXIDATION
SILICON ETCH WITH PASSIVATION USING PLASMA ENHANCED OXIDATIONA method and apparatus for etching a silicon layer through a patterned mask formed thereon are provided. The silicon layer is placed in an etch chamber. An etch gas comprising a fluorine containing gas and an oxygen and hydrogen containing...
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Format | Patent |
Language | English |
Published |
30.12.2013
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Abstract | SILICON ETCH WITH PASSIVATION USING PLASMA ENHANCED OXIDATIONA method and apparatus for etching a silicon layer through a patterned mask formed thereon are provided. The silicon layer is placed in an etch chamber. An etch gas comprising a fluorine containing gas and an oxygen and hydrogen containing gas is provided into the etch chamber. A plasma is generated from the etch gas and features are etched into the silicon layer using the plasma. The etch gas is then stopped. The plasma may contain OH radicals.FIG. 1 |
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AbstractList | SILICON ETCH WITH PASSIVATION USING PLASMA ENHANCED OXIDATIONA method and apparatus for etching a silicon layer through a patterned mask formed thereon are provided. The silicon layer is placed in an etch chamber. An etch gas comprising a fluorine containing gas and an oxygen and hydrogen containing gas is provided into the etch chamber. A plasma is generated from the etch gas and features are etched into the silicon layer using the plasma. The etch gas is then stopped. The plasma may contain OH radicals.FIG. 1 |
Author | CHEBI, ROBERT P WINNICZEK, JAROSLAW W |
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Notes | Application Number: SG20130079231 |
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Snippet | SILICON ETCH WITH PASSIVATION USING PLASMA ENHANCED OXIDATIONA method and apparatus for etching a silicon layer through a patterned mask formed thereon are... |
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SubjectTerms | BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
Title | SILICON ETCH WITH PASSIVATION USING PLASMA ENHANCED OXIDATION |
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