MAINTENANCE EXPERT SYSTEM FOR MEASURING INSTRUMENT

• Main Authors: SAITOH, SHUNJI, KAMEYAMA, TATSUMI
• Format: Patent
• Language: English
• Published: 28.11.2011
• Subjects: ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS; CALCULATING; COMPUTING; COUNTING; DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES; MEASURING; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR; MEASURING QUANTITY OF HEAT; MEASURING TEMPERATURE; MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUIDLEVEL; METERING BY VOLUME; PHYSICS; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR; TARIFF METERING APPARATUS; TESTING; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR

MAINTENANCE EXPERT SYSTEM FOR MEASURING INSTRUMENT AbstractProvided is a measuring instrument for measuring an object to be measured, including: a CPU (9) including a plurality of internal timer counters and having a function of calculating a measured value of the object to be measured based on detection values of various sensors; a power supply circuit (3) for supplying power to the CPU (9); a detector (4) for detecting a state of the object to be measured; a display unit (5) for displaying detection input data input from the various sensors and the state of the object to be measured, which is obtained through a calculation; areal-time clock IC (RTC) (11) for measuring an elapsed time; an EEPROM (12) for storing data input to the CPU (9); and an FeRAM (13) for storing input values from the various sensors, and storing a calculation result obtained through a calculation performed by the CPU (9) based on the input values from the various sensors. Fig. 1