Computerized control of industrial process involves measuring process fault, predicting future deviations in process variables related to fault, generating control signal using control rule
The method involves measuring process variable values, predicting future deviations of a process variable relative to the measured value, generating a control signal based on the prediction with a first control rule, measuring a process fault, predicting future deviations in process variables relate...
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Main Authors | , |
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Format | Patent |
Language | English Swedish |
Published |
01.07.2003
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Edition | 7 |
Subjects | |
Online Access | Get full text |
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Summary: | The method involves measuring process variable values, predicting future deviations of a process variable relative to the measured value, generating a control signal based on the prediction with a first control rule, measuring a process fault, predicting future deviations in process variables related to the fault without recourse to the measured value and generating a control signal based on the prediction with a second control rule. The method involves measuring the values of at least one process variable, predicting future deviations of a process variable relative to the measured value of the variable(s), generating a control signal based on the prediction with a first control rule, measuring a measurable fault in the process, predicting future deviations in process variables related to the fault, but without recourse to the measured value of the process variable(s), and generating a control signal based on the prediction with a second control rule. Independent claims are also included for the following: a computerized system for controlling an industrial process and a computer program code element. |
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Bibliography: | Application Number: SE19990003592 |