RONTGENSPEKTROMETER

• Main Authors: LARRIBAU E, SAHORES J
• Format: Patent
• Language: Swedish
• Published: 23.08.1976
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS; ELECTRICITY; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

1413611 X-ray spectrometers; electron beam apparatus SOC NATIONALE DES PETROLES D'AQUITAINE 8 June 1973 [8 June 1972] 27396/73 Heading H1D [Also in Division H5] An X-ray spectrometer apparatus comprises a cold cathode electron source 1 producing a beam of electrons which is deflected at 22 and focused at 21 on to a rotating sample 131, a curved crystal 14 for analysing the X-rays from the specimen and focusing them on the inlet slit of a gas flux counter 15. The electron source, Figs. 6 and 7 (not shown), comprises a cold cathode (4) in the form of a circle or line and an anode (2) having an aperture (3) shaped as a circle or line, the arrangement being such as to produce a beam having a narrow rectangular cross-section, e.g. 0À5 mm. by 20À0 mm. Fig. 11 (not shown) depicts a sample holder for powder consisting of an annular channel and blades arranged to smooth the powder as the holder rotates. An electrostatic focusing arrangement, Fig. 13 (not shown), comprises successively narrower slits through which the beam passes, the slits being at adjustable negative potentials.