METHOD FOR POLISHING OF WAFERS OF CERAMIC MATERIALS
semiconductor equipment, applicable in production of passive boards for hybrid integrated circuits. SUBSTANCE: the method for polishing consists in influence of a tool and polishing compound on the wafer surface. The polishing compound contains diamond powder, glycerin and a synthetic detergent. Dil...
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
10.05.2001
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Edition | 7 |
Subjects | |
Online Access | Get full text |
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Abstract | semiconductor equipment, applicable in production of passive boards for hybrid integrated circuits. SUBSTANCE: the method for polishing consists in influence of a tool and polishing compound on the wafer surface. The polishing compound contains diamond powder, glycerin and a synthetic detergent. Diluent is dosed to the zone of treatment. The quantities of polishing compound and diluent are taken from relation 1:(3-6) relative units respectively. Polishing is carried out to a depth of at least 30mum, at least in two stages. I n the first stage water is used as diluent, and in the second stage - 3.4-11.0 - percent colloidal solution of silicon dioxide. In the second stage the allowance of 15 mum is removed. EFFECT: improved quality of surface for subsequent bonding of wafers by vacuum deposition. 1 tbl, 1 ex |
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AbstractList | semiconductor equipment, applicable in production of passive boards for hybrid integrated circuits. SUBSTANCE: the method for polishing consists in influence of a tool and polishing compound on the wafer surface. The polishing compound contains diamond powder, glycerin and a synthetic detergent. Diluent is dosed to the zone of treatment. The quantities of polishing compound and diluent are taken from relation 1:(3-6) relative units respectively. Polishing is carried out to a depth of at least 30mum, at least in two stages. I n the first stage water is used as diluent, and in the second stage - 3.4-11.0 - percent colloidal solution of silicon dioxide. In the second stage the allowance of 15 mum is removed. EFFECT: improved quality of surface for subsequent bonding of wafers by vacuum deposition. 1 tbl, 1 ex |
Author | ROGOV V.V SAVUSHKIN JU.A |
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Snippet | semiconductor equipment, applicable in production of passive boards for hybrid integrated circuits. SUBSTANCE: the method for polishing consists in influence... |
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SubjectTerms | DRESSING OR CONDITIONING OF ABRADING SURFACES FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS GRINDING MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING PERFORMING OPERATIONS POLISHING TRANSPORTING |
Title | METHOD FOR POLISHING OF WAFERS OF CERAMIC MATERIALS |
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