METHOD AND DEVICE FOR DETERMINATION OF CONCENTRATION OF ELECTRONS WITHIN THE PRESET AREA OF IONOSPHERE

radio detection and ranging, in particular, radio engineering measurements of ionosphere parameters by the method of incoherent scattering with the use of the Faraday effect, applicable for determination of concentration of electrons in the preset thin layer of ionospheric plasma, which depends on t...

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Bibliographic Details
Main Authors DIKAREV V.I, EPIKHIN A.I, KOZLOV E.P, DENISOV G.A, ROGALEV V.A, RUMJANTSEV A.A
Format Patent
LanguageEnglish
Published 10.01.2001
Edition7
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Summary:radio detection and ranging, in particular, radio engineering measurements of ionosphere parameters by the method of incoherent scattering with the use of the Faraday effect, applicable for determination of concentration of electrons in the preset thin layer of ionospheric plasma, which depends on the presence of radioactive impurities in the zone of atmosphere under observation, for example, over a nuclear power plant. SUBSTANCE: unusual component of the reflected signal is subjected to frequency conversion, intermediate-frequency voltage is discriminated, multiplied by a usual component, harmonic voltage is discriminated at the frequency of the local oscillator, it is limited in amplitude, the phase difference at this frequency is measured, the concentration of electrons is computed, compared with the reference values, and, proceeding from the results of comparison, decisions are taken on the presence and concentration of radioactive impurities in the preset area of ionosphere. The device for realization of the method has: synchronizing unit (1), transmitter (2), transmitting antenna (3), receiving antennas (5),(6), receivers (7) and (8), key (9), multiplier (13), time-delay unit (4), mixer (11), local oscillator (10), amplifier (12), narrow-band filter (14), amplitude limiter (15), phase-meter (16), computing unit (17), comparison unit (18), key (19), indicator (20). EFFECT: enhanced accuracy of determination of concentration of electrons. 2 cl, 1 dwg
Bibliography:Application Number: RU19990102118