PROBE HEAD FOR A TESTING APPARATUS OF ELECTRONIC DEVICES WITH ENHANCED FILTERING PROPERTIES

A probe head (20) is described comprising a plurality of contact probes (21A, 21B, 21C) being slidably housed in respective pluralities of guide holes (25A, 27A, 29A, 36A; 25B, 27B, 29B, 36B; 28C, 29C, 36C) being realized in a plate-shaped support (22), the plurality of contact probes (21A, 21B, 21C...

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Bibliographic Details
Main Author MAGGIONI, Flavio
Format Patent
LanguageEnglish
Published 04.11.2019
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:A probe head (20) is described comprising a plurality of contact probes (21A, 21B, 21C) being slidably housed in respective pluralities of guide holes (25A, 27A, 29A, 36A; 25B, 27B, 29B, 36B; 28C, 29C, 36C) being realized in a plate-shaped support (22), the plurality of contact probes (21A, 21B, 21C) comprising at least a first group of contact probes (21A, 21B) carrying ground and power supply signals (GND, PWR). Opportunely, the probe head (20) comprises at least one filtering capacitor (30) having at least one rheophore (31) being electrically connected to a conductive portion (22A, 27A) realized on the support (22) and including at least one housing guide hole (25A, 29A) of a contact probe (21A, 21B) of the first group.
Bibliography:Application Number: PH20191501352