Method for cultivating scab - resistant and high - yield wheat in Huanghuai wheat area based on multi - gene polymerization

Disclosed is a method for cultivating scab-resistant and high-yield wheat in wheat regions, 5 in particular in the Huanghuai wheat region, based on polygene polymerization. In the method, the scab-resistant intermediate material NMASOZO with excellent comprehensive agronomic characters carrying a pl...

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Main Authors AIFENG LIU, XUEYAN CHEN, JUN GUO, JIANMIN SONG, HAOSHENG LI, XIAOLU WANG, RAN HAN, DUNGONG CHENG, FAJI LI, YAN ZI, WENJING HU, XINYOU CAO, XIUSHENG CHU, SHENGNAN ZHAI, JIANJUN LIU, CHENG LIU
Format Patent
LanguageEnglish
Published 16.04.2024
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Summary:Disclosed is a method for cultivating scab-resistant and high-yield wheat in wheat regions, 5 in particular in the Huanghuai wheat region, based on polygene polymerization. In the method, the scab-resistant intermediate material NMASOZO with excellent comprehensive agronomic characters carrying a plurality of scab-resistant genes is used as the resistance source, and the large-area varieties and excellent strains in wheat region are used as the background parents. Using molecular markers linked markers LJJ-1 of th1, linked markers LJJ-2 and LJJ-3 of 10 th2, and linked markers LJJ-4 and LJJ-5 of th5 assisted selection combined with identification techniques for resistance to expansion and infection of scab, the semi-winter breeding materials or lines with good adaptability and comprehensive characters were created, which provided a material source for cultivating high-yield wheat varieties with scab resistance suitable for planting in the wheat area.
Bibliography:Application Number: NL20222031181