METHOD FOR SCREENING HIGH-YIELD WAXY WHEAT

• Main Authors: AIFENG LIU, JUN GUO, JIANMIN SONG, HAOSHENG LI, XIAOLU WANG, RAN HAN, DUNGONG CHENG, ZHENDONG ZHAO, FAJI LI, YAN ZI, XINYOU CAO, CANGUO WANG, SHENGNAN ZHAI, JIANJUN LIU, CHENG LIU, WEI JU
• Format: Patent
• Language: English
• Published: 02.01.2023
• Subjects: AGRICULTURE; ANIMAL HUSBANDRY; BEER; BIOCHEMISTRY; CHEMISTRY; COMPOSITIONS THEREOF; CULTIVATION OF VEGETABLES, FLOWERS, RICE, FRUIT, VINES, HOPSOR SEAWEED; CULTURE MEDIA; ENZYMOLOGY; FISHING; FORESTRY; HORTICULTURE; HUMAN NECESSITIES; HUNTING; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; METALLURGY; MICROBIOLOGY; MICROORGANISMS OR ENZYMES; MUTATION OR GENETIC ENGINEERING; NEW PLANTS OR PROCESSES FOR OBTAINING THEM; PHYSICS; PLANT REPRODUCTION BY TISSUE CULTURE TECHNIQUES; PROPAGATING, PRESERVING OR MAINTAINING MICROORGANISMS; SPIRITS; TESTING; TRAPPING; VINEGAR; WATERING; WINE

The present disclosure provides a method for screening high-yield waxy wheat, and belongs to the technical field of wheat breeding. The AGPase enzyme activity and SBE activity of grains are determined 30-35 days after anthesis of waxy wheat to be tested. 5 The waxy wheat to be tested is a high-yield wheat cultivar when the AGPase enzyme activity is greater than 34 U~g'1~FW~min'1 and the SBE activity is greater than or equal to 5.5 U~g'1~FW~min'1. Compared with the traditional technology, the method of the present disclosure can predict the wheat yield in advance in the waxy wheat planting stage, and can effectively shorten the breeding cycle.