TILED RADIATION DETECTOR

The present approaches relate to the fabrication of non-rectangular (e.g., non-square) light imager panels having comparable active areas to rectangular light imager panels but manufactured using fewer c-Si wafers. Such light imager panels may be generally squircle shaped (e.g., a square or rectangl...

Full description

Saved in:
Bibliographic Details
Main Author JAMES ZHENGSHE LIU
Format Patent
LanguageEnglish
Published 11.08.2017
Subjects
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
TESTING
Online AccessGet full text

Cover

More Information
Summary:The present approaches relate to the fabrication of non-rectangular (e.g., non-square) light imager panels having comparable active areas to rectangular light imager panels but manufactured using fewer c-Si wafers. Such light imager panels may be generally squircle shaped (e.g., a square or rectangle with one or more rounded corners and may be manufactured using conventional crystalline silicon (c-Si) wafers, such as 8" wafers.
Bibliography:Application Number: NL20162018084