OPTOELECTRONIC AUTOMATED SYSTEM FOR DETECTING TRAP LEVELS IN SEMICONDUCTOR MATERIALS
Described is an automated system for detecting traps in semiconductor materials, which allows the activation energy of the traps to be determined in the deep and shallow levels of the energy gap, using the PICTS technology. This system is useful for acquiring information, processing and analyzing th...
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Main Authors | , , |
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Format | Patent |
Language | English Spanish |
Published |
01.06.2017
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Subjects | |
Online Access | Get full text |
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Summary: | Described is an automated system for detecting traps in semiconductor materials, which allows the activation energy of the traps to be determined in the deep and shallow levels of the energy gap, using the PICTS technology. This system is useful for acquiring information, processing and analyzing the same and graphing the results in real time in an automatic form by means of software developed for this system. The system of the present invention is a unit that enables an easy implementation for the characterization of semiconductors. The advantages are: reducing the intervention of an operator; reducing the time of analysis and presenting the results in a visual form in real time.
Se describe un sistema automático para la detección de trampas en materiales semiconductores, permite determinar la energía de activación de las trampas en los niveles profundos y poco profundos de la brecha de energía, utilizando la técnica PICTS. Este sistema permite la adquisición de información, su procesamiento, análisis y grafica los resultados en tiempo real en forma automática mediante un software desarrollado para este sistema. El sistema de la presente invención es una unidad que permite una fácil implementación para la caracterización de semiconductores. Entre sus ventajas se encuentra: Reducir la intervención de un operador; Reducir tiempo de análisis y Presentar resultados en forma visual y en tiempo real. |
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Bibliography: | Application Number: MX20120013219 |