FAIL REPAIR METHOD AND CIRCUIT FOR SEMICONDUCTOR MEMORY DEVICE
The semiconductor memory device is for supplying a memory block selected in test mode with a source power voltage by comprising: a block free decoder outputting the decoding result of a block selecting signal from the external as a block selecting signal; a test pad inputting a test control signal a...
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
24.09.1996
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Edition | 6 |
Subjects | |
Online Access | Get full text |
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Summary: | The semiconductor memory device is for supplying a memory block selected in test mode with a source power voltage by comprising: a block free decoder outputting the decoding result of a block selecting signal from the external as a block selecting signal; a test pad inputting a test control signal applied from the external; and a block row decoder charging the power voltage line corresponding to the selected memory block to a source power voltage level by composing the test control signal and the block selecting signal. |
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Bibliography: | Application Number: KR19940000514 |