입계 산화층의 막 두께 산출 방법, 도금성 판정 방법, 도금 강판의 제조 방법, 및 막 두께 산출 장치

• Main Authors: KOBAYASHI MASANORI, FUKUSHIMA KOKI, HAYASHI KAZUSHI, SASAKI KOJI, INUI MASAHIRO
• Format: Patent
• Language: Korean
• Published: 08.07.2024
• Subjects: CHEMICAL SURFACE TREATMENT; CHEMISTRY; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; COATING MATERIAL WITH METALLIC MATERIAL; COATING METALLIC MATERIAL; DIFFUSION TREATMENT OF METALLIC MATERIAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; METALLURGY; PHYSICS; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; TESTING

본 발명의 한 양태에 따른 입계 산화층의 막 두께 산출 방법은, 산세척 처리 후의 강판에 잔존하고 있는 입계 산화층의 막 두께 산출 방법으로서, 상기 강판에 포함되는 것과 동시에, 상기 입계 산화층 내의 산화물을 구성하고 있는 원소에 대한 형광 X선 강도를 측정하는 강도 측정 공정과, 상기 입계 산화층의 막 두께를, 미리 추출되어 있는 형광 X선 강도와 입계 산화층의 막 두께의 상관 관계 및 상기 강도 측정 공정에서 측정된 상기 형광 X선 강도에 근거하여 산출하는 막 두께 산출 공정을 구비한다. An aspect of the present invention is a method for calculating a film thickness of a grain boundary oxide layer remaining on a steel sheet after a pickling treatment, the method including: an intensity-measuring step in which a fluorescent X-ray intensity of an element being contained in the steel sheet and constituting an oxide in the grain boundary oxide layer is measured; and a film thickness-calculating step in which a film thickness of the grain boundary oxide layer is calculated based on: a correlation between a pre-extracted fluorescent X-ray intensity and the film thickness of the grain boundary oxide layer; and the fluorescent X-ray intensity measured in the intensity-measuring step.