TEST SOCKET

The present invention is to provide a test socket that has a minimum length suitable for electrical testing of a semiconductor device, and has a stable stroke and excellent electrical characteristics. The test socket according to an embodiment of the present invention includes a configuration in whi...

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Bibliographic Details
Main Authors KOO CHEOL HOE, SHIM YUN HEE, KIM YONG KI, KIM WON WOO, SONG BYUNG CHANG, OH TAE SEUNG, KIM DONG IL, HAM JU WON, HEO JIN HYANG
Format Patent
LanguageEnglish
Korean
Published 17.05.2023
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:The present invention is to provide a test socket that has a minimum length suitable for electrical testing of a semiconductor device, and has a stable stroke and excellent electrical characteristics. The test socket according to an embodiment of the present invention includes a configuration in which at least one layer of spiral plates is stacked through a central or outer part. 본 발명은 반도체 소자의 전기적 테스트에 적합한 최소 길이를 가지면서도 안정된 스트로크 및 우수한 전기적 특성을 갖는 테스트 소켓을 제공하고자 한다. 본 발명의 일 실시예에 따른 테스트 소켓은 적어도 한 층 이상의 나선형 플레이트가 중심부 또는 외측부를 통해 적층된 구성을 포함한다.
Bibliography:Application Number: KR20210152582