SOLID-STATE QUBIT IMAGING APPARATUS

• Main Authors: KIM JE HYUNG, MOON JONG SUNG
• Format: Patent
• Language: English; Korean
• Published: 24.03.2023
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The present invention is to enable an individual optical access to single spins of multiple defects, which could not be spatially separated in the conventional confocal microscopy, with a high signal contrast compared to the prior art. An imaging apparatus according to the present embodiment includes a microsphere located in a sample and disposed on a defect that provides a single photon and a quantum spin; an optical system providing light to the microsphere and imaging the defect through the microsphere; and a signal processing unit receiving light formed from the defect and converting the light into a corresponding electrical signal. 본 실시예에 의한 이미징 장치는, 샘플 내에 위치하여 단일 광자와 양자 스핀을 제공하는 결함(defect) 상에 배치된 미소구체(microsphere); 상기 미소구체에 광을 제공하고, 상기 미소구체를 통하여 상기 결함을 이미징하는 광학계 및 상기 결함에서 형성된 광을 제공받고, 상응하는 전기적 신호로 변환하는 신호 처리부를 포함한다.