SEMICONDUCTOR DEVICE SEMICONDUCTOR PACKAGE AND METHOD OF MANUFACTURING THE SAME

An objective of the present invention is to provide a semiconductor package with improved reliability. According to one embodiment of the present invention, the semiconductor package comprises: a first semiconductor chip having a first substrate, a first insulation layer arranged on the first substr...

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Bibliographic Details
Main Authors KIM BYEONG CHAN, SONG SOL JI, KANG UN BYOUNG, PARK JUM YONG, LEE CHUNG SUN
Format Patent
LanguageEnglish
Korean
Published 13.03.2023
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Summary:An objective of the present invention is to provide a semiconductor package with improved reliability. According to one embodiment of the present invention, the semiconductor package comprises: a first semiconductor chip having a first substrate, a first insulation layer arranged on the first substrate, and a plurality of first connection pads arranged on the insulation layer, and having a flat upper surface provided by the upper surface of the first insulation layer and the upper surfaces of the plurality of first connection pads; and a second semiconductor chip arranged on the upper surface of the first semiconductor chip, and having a second substrate, a second insulation layer arranged below the second substrate and coming in contact with the first insulation layer, and a plurality of second connection pads arranged on the second insulation layer and coming in contact with the plurality of first connection pads. The first insulation layer includes an insulating interfacial layer buried in the first insulation layer while coming in contact with the second insulation layer, and separated from the plurality of first connection pads. 본 발명의 일 실시예는, 제1 기판과, 상기 제1 기판 상에 배치된 제1 절연층과, 상기 제1 절연층에 배열된 복수의 제1 연결 패드들을 가지며, 상기 제1 절연층의 상면과 상기 복수의 제1 연결 패드들의 상면에 의해 제공되는 평탄한 상면을 갖는 제1 반도체 칩; 및 상기 제1 반도체 칩의 상기 상면에 배치되며, 제2 기판과, 상기 제2 기판 아래에 배치되며 상기 제1 절연층과 접하는 제2 절연층과, 상기 제2 절연층에 배열되며 상기 복수의 제1 연결 패드들에 각각 접하는 복수의 제2 연결 패드들을 갖는 제2 반도체 칩;를 포함하며, 상기 제1 절연층은 상기 제2 절연층에 접하면서 상기 제1 절연층에 매립되며, 상기 복수의 제1 연결 패드들로부터 이격된 절연성 계면층(insulating interfacial layer)을 포함하는 반도체 패키지를 제공한다.
Bibliography:Application Number: KR20210117673