PROBE DEVICE OF INSTRUMENT

The present invention relates to a probe device of an instrument, which includes: a measurement unit; a probe unit which is connected to the measurement unit and is grippable by a user; and a terminal unit into which the probe unit is inserted to be installed and mounted on an object to be measured....

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Bibliographic Details
Main Authors KIM SOO YONG, SEONG WON JUN
Format Patent
LanguageEnglish
Korean
Published 29.07.2022
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:The present invention relates to a probe device of an instrument, which includes: a measurement unit; a probe unit which is connected to the measurement unit and is grippable by a user; and a terminal unit into which the probe unit is inserted to be installed and mounted on an object to be measured. Therefore, a user can conveniently and safely obtain information on the object to be measured. 본 발명은 계측기의 탐침장치에 관한 것으로, 계측부와, 계측부에 연결되고 사용자가 파지 가능한 탐침부와, 탐침부가 삽입되어 거치되고 측정대상물에 장착되는 단자부를 포함하여, 사용자가 편리하게 안전하게 측정대상물에 대한 정보를 취득할 수 있다.
Bibliography:Application Number: KR20210009357