A coating thickness measuring apparatus and method using optical properties of painted surface

The present invention proposes a coating thickness measurement apparatus and measurement method, wherein a coating thickness is measured in a non-contact way by using a relation between optical properties of a coated surface and a coating thickness. The coating thickness measurement apparatus using...

Full description

Saved in:
Bibliographic Details
Main Authors KIM TAI GON, SON TAE WOOK, KIM JINUK
Format Patent
LanguageEnglish
Korean
Published 15.07.2022
Subjects
EQUIPMENT FOR SHIPPING
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PERFORMING OPERATIONS
PHYSICS
RELATED EQUIPMENT
SHIPS OR OTHER WATERBORNE VESSELS
TESTING
TRANSPORTING
Online AccessGet full text

Cover

More Information
Summary:The present invention proposes a coating thickness measurement apparatus and measurement method, wherein a coating thickness is measured in a non-contact way by using a relation between optical properties of a coated surface and a coating thickness. The coating thickness measurement apparatus using optical properties of the coated surface comprises a camera, a spectral radiant luminance meter, an image processor, a database, and an image analyzer. 본 발명은 도장 표면의 광학적 특성과 도막 두께의 상관관계를 이용하여 비접촉식으로 도막의 두께를 측정하는 도장 표면의 광학적 특정을 이용한 도막 두께 측정장치 및 측정방법을 제안한다. 상기 도장 표면의 광학적 특정을 이용한 도막 두께 측정장치는, 카메라, 분광방사휘도계, 이미지 프로세서, 데이터베이스 및 영상분석기를 포함한다.
Bibliography:Application Number: KR20210002368