X- 3 3D MATERIAL ANALYSIS DEVICE AND ANALYSIS METHOD USING X-RAY ENERGY

• Main Authors: WOO SEONG CHEOL, JIN KYUNG CHAN, LEE SUNG HO, EUN YOUNG KEE
• Format: Patent
• Language: English; Korean
• Published: 05.04.2022
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The present invention relates to a three-dimensional substance analysis apparatus using X-ray energy, and an analysis method thereof and, more specifically, to a three-dimensional substance analysis apparatus using X-ray energy, capable of deriving the components and spatial position of a moving thr...