Apparatus and method for analyzing samples

The present invention provides a sample analyzing device. The present invention comprises: a base; a connector disposed at an end of the base; a temperature adjusting member mounted on the base to adjust a temperature of the connector; and a controller for adjusting a bonding force of a pipette tip...

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Bibliographic Details
Main Author SON MUN TAK
Format Patent
LanguageEnglish
Korean
Published 28.03.2022
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:The present invention provides a sample analyzing device. The present invention comprises: a base; a connector disposed at an end of the base; a temperature adjusting member mounted on the base to adjust a temperature of the connector; and a controller for adjusting a bonding force of a pipette tip attached to one surface of the connector by adjusting heat generated by the temperature adjusting member. 본 발명은 검체 분석 장치를 제공한다. 본 발명은 베이스와, 상기 베이스의 단부에 배치되는 커넥터와, 상기 베이스에 장착되되, 상기 커넥터의 온도를 조절하는 온도 조절 부재, 및 상기 온도 조절 부재의 발열을 조절하여 상기 커넥터의 일면에 부착되는 피펫 팁의 접합력을 조절하는 컨트롤러를 포함한다.
Bibliography:Application Number: KR20220030816