MCU MCU FAULT DETECTION APPARATUS AND METHOD

The present disclosure relates to an MCU failure detection device and method. Specifically, the MCU failure detection device according to the present disclosure includes: a reception unit for receiving first watchdog output information for failure determination from an electronic control device; a d...

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Bibliographic Details
Main Authors YOON CHAI WON, PARK JONG GYU
Format Patent
LanguageEnglish
Korean
Published 08.03.2022
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Summary:The present disclosure relates to an MCU failure detection device and method. Specifically, the MCU failure detection device according to the present disclosure includes: a reception unit for receiving first watchdog output information for failure determination from an electronic control device; a determination unit for determining whether the electronic control device has failed based on the first watchdog output information; and a transmission unit for transmitting a first reset signal to the electronic control device, when determined that the electronic control device has failed. 본 개시는 MCU 고장 검출 장치 및 방법에 관한 것이다. 구체적으로 본 개시에 따른 MCU 고장 검출 장치는 전자 제어 장치로부터 고장 판단을 위한 제1 워치독 출력 정보를 수신하는 수신부, 제1 워치독 출력 정보를 기초로 전자 제어 장치의 고장 여부를 판단하는 판단부 및 전자 제어 장치가 고장이라고 판단된 경우, 전자 제어 장치로 제1 리셋 신호를 전송하는 송신부를 포함한다.
Bibliography:Application Number: KR20200108227