APPARATUS AND METHOD FOR EXTRACTING METER DATA

The present invention relates to an abnormal weighing data extraction method, which includes the steps of: receiving a set of reference information regarding a failure type; receiving weighing data for a certain period of time; extracting measurement information about at least one of voltage and cur...

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Bibliographic Details
Main Authors CHO JUNG WON, BAE JOO YEON, KIM WAN HOE, NA YEONG SEOK, PARK JONG IL
Format Patent
LanguageEnglish
Korean
Published 04.02.2022
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:The present invention relates to an abnormal weighing data extraction method, which includes the steps of: receiving a set of reference information regarding a failure type; receiving weighing data for a certain period of time; extracting measurement information about at least one of voltage and current based on the received measurement data; classifying the measurement data as normal or abnormal by comparing the extracted measurement information with the reference information; and displaying the weighing data when the weighing data is abnormal. Therefore, it is possible to identify a type of failure and take an action more quickly. 본 발명은 비정상 계량데이터 추출 방법으로서, 고장 유형에 관한 일련의 기준 정보를 수신하는 동작; 일정 기간 동안의 계량데이터를 수신하는 동작; 상기 수신된 계량데이터 기초하여, 전압 및 전류 중 적어도 하나에 관한 계량 정보를 추출하는 동작; 상기 추출된 계량 정보와 상기 기준 정보를 비교하여, 상기 계량데이터를 정상 또는 비정상으로 분류하는 동작; 및 상기 계량데이터가 비정상인 경우, 상기 계량데이터를 디스플레이하는 동작을 포함한다.
Bibliography:Application Number: KR20200091823