Inspection device

An embodiment of the present invention provides an inspection apparatus comprising: a non-magnetic support unit; at least two permanent magnetic units in a toroid shape which are arranged at an interval with the non-magnetic support unit; a hole sensor unit which is placed between the permanent magn...

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Bibliographic Details
Main Authors LEE YONG KYU, KIM HUI MIN
Format Patent
LanguageEnglish
Korean
Published 22.10.2021
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:An embodiment of the present invention provides an inspection apparatus comprising: a non-magnetic support unit; at least two permanent magnetic units in a toroid shape which are arranged at an interval with the non-magnetic support unit; a hole sensor unit which is placed between the permanent magnetic units; and a defect determination unit which determines a defect by receiving a signal from the hole sensor unit. The inspection apparatus facilitates movement for inspection. 본 발명의 일 측면에 따르면, 비자성체 지지부와, 상기 비자성체 지지부에 간격을 두고 배치되는 적어도 2개의 토로이드 형상의 영구 자석부와, 상기 영구 자석부 사이에 배치되는 홀 센서부와, 상기 홀 센서부로부터 신호를 받아 결함을 판별하는 결함 판별부를 포함하는 검사 장치를 제공한다.
Bibliography:Application Number: KR20200045259