APPARATUS AND METHOD FOR ANALYZING COMPOSITION AND IMPEDANCE MEASURING APPARATUS

A composition analysis apparatus is disclosed. According to an embodiment, a composition analysis apparatus may include an electrode part in which a plurality of electrodes having an optimal width of the electrode determined based on an effective measurement depth and an electrode interval are arran...

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Bibliographic Details
Main Authors NAM, SUNG HYUN, PARK, MOON SEONG, EOM, KUN SUN, PARK, YUN SANG, JUNG, MYOUNG HOON
Format Patent
LanguageEnglish
Korean
Published 26.07.2021
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Summary:A composition analysis apparatus is disclosed. According to an embodiment, a composition analysis apparatus may include an electrode part in which a plurality of electrodes having an optimal width of the electrode determined based on an effective measurement depth and an electrode interval are arranged; an impedance measuring part that includes an electrode control part for applying a current to a first electrode and a second electrode among the plurality of electrodes and measuring the impedance based on the voltage between a third electrode and a fourth electrode, and a processor that analyzes the composition of an analysis object based on the impedance for the composition analysis measured from the analysis object. An object of the present invention is to provide an impedance measuring device with optimal electrode width in consideration of effective measuring depth. 성분 분석 장치가 개시된다. 일 실시예에 따르면 성분 분석 장치는 유효 측정 깊이 및 전극 간격을 기초로 결정된 전극의 최적 너비를 갖는 복수의 전극이 배열된 전극부와, 상기 복수의 전극 중 제1 전극 및 제2 전극에 전류를 인가하고 제3 전극 및 제4 전극 사이의 전압을 기초로 임피던스를 측정하는 전극 제어부를 포함하는 임피던스 측정부 및 분석 대상으로부터 측정된 성분 분성을 위한 임피던스를 기초로 분석 대상의 성분을 분석하는 프로세서를 포함할 수 있다.
Bibliography:Application Number: KR20200006139