Centralized machine vision inspection system and methods for preventing missing items and managing history

• Main Author: LEE JISOO
• Format: Patent
• Language: English; Korean
• Published: 06.07.2021
• Subjects: CALCULATING; COMPUTING; COUNTING; DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR; TESTING

Disclosed are a centralized machine vision inspection system and a method for preventing omission of inspection items and managing history. The present invention provides a technique for configuring a system for notifying each vision device of a result after inspecting an image acquired through a vision equipment in each process in a centralized server. Accordingly, the present invention contributes to solving problems of the existing invention and business. The centralized machine vision inspection system of the present invention comprises: the vision equipment; the centralized server PC; an image inspection software; and a database. 중앙 집중형 머신 비전 검사 시스템과 검사항목 누락 방지 및 이력관리에 대한 방법이 개시된다. , 각 공정에서 비전 장비를 통해 취득한 화상 이미지를 중앙 집중형 서버에서 검사한 후 각 비전 장비에 결과를 통지하기 위한 시스템을 구성하는 기술을 제공하여, 기존의 발명과 현업의 문제점을 해결하는 데에 이바지한다.