SiC HIGH QUALITY SILICON CARBIDE CRYSTAL AND METHOD FOR GROWING THE SAME

The present disclosure relates to a method for growing SiC single crystals which comprises: a step of positioning seeds in a reactor; a first step of raising an internal temperature of the reactor to a growing temperature and reducing an internal pressure of the reactor to a growing pressure; a seco...

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Main Authors SEO HAN SEOK, KIM JANG YUL, EUN TAI HEE, CHUN MYONG CHUEL, YEO IM GYU, LEE SEUNG SEOK
Format Patent
LanguageEnglish
Korean
Published 01.07.2021
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Abstract The present disclosure relates to a method for growing SiC single crystals which comprises: a step of positioning seeds in a reactor; a first step of raising an internal temperature of the reactor to a growing temperature and reducing an internal pressure of the reactor to a growing pressure; a second step of reducing a partial pressure of nitrogen gas with respect to mixed gas of inert gas and the nitrogen gas while maintaining the internal temperature and the internal pressure of the reactor; and a third step of maintaining the temperature and the pressure of the reactor and the partial pressure of the nitrogen gas to grow SiC single crystals, wherein a speed for reducing the partial pressure of the nitrogen gas in the second step is more than 0.002/h to less than 0.05/h. 본 개시는 SiC 단결정 성장 방법에 관한 것으로 종자정을 반응기 내에 위치시키는 단계; 상기 반응기 내부 온도를 성장 온도로 승온시키고, 반응기 내부 압력을 성장 압력까지 감압시키는 제1단계; 상기 반응기의 내부 온도 및 내부 압력은 유지하면서 불활성 가스 및 질소 가스 혼합 가스에 대한 질소가스 분압을 감소시키는 제2단계; 및 상기 반응기의 온도, 압력 및 질소가스 분압을 유지하여 SiC 단결정을 성장시키는 제3단계; 를 포함하고, 상기 제2단계에서 질소가스 분압을 감소시키는 속도는 0.002 초과 0.05/h 미만일 수 있다.
AbstractList The present disclosure relates to a method for growing SiC single crystals which comprises: a step of positioning seeds in a reactor; a first step of raising an internal temperature of the reactor to a growing temperature and reducing an internal pressure of the reactor to a growing pressure; a second step of reducing a partial pressure of nitrogen gas with respect to mixed gas of inert gas and the nitrogen gas while maintaining the internal temperature and the internal pressure of the reactor; and a third step of maintaining the temperature and the pressure of the reactor and the partial pressure of the nitrogen gas to grow SiC single crystals, wherein a speed for reducing the partial pressure of the nitrogen gas in the second step is more than 0.002/h to less than 0.05/h. 본 개시는 SiC 단결정 성장 방법에 관한 것으로 종자정을 반응기 내에 위치시키는 단계; 상기 반응기 내부 온도를 성장 온도로 승온시키고, 반응기 내부 압력을 성장 압력까지 감압시키는 제1단계; 상기 반응기의 내부 온도 및 내부 압력은 유지하면서 불활성 가스 및 질소 가스 혼합 가스에 대한 질소가스 분압을 감소시키는 제2단계; 및 상기 반응기의 온도, 압력 및 질소가스 분압을 유지하여 SiC 단결정을 성장시키는 제3단계; 를 포함하고, 상기 제2단계에서 질소가스 분압을 감소시키는 속도는 0.002 초과 0.05/h 미만일 수 있다.
Author EUN TAI HEE
KIM JANG YUL
YEO IM GYU
CHUN MYONG CHUEL
LEE SEUNG SEOK
SEO HAN SEOK
Author_xml – fullname: SEO HAN SEOK
– fullname: KIM JANG YUL
– fullname: EUN TAI HEE
– fullname: CHUN MYONG CHUEL
– fullname: YEO IM GYU
– fullname: LEE SEUNG SEOK
BookMark eNqNyrsKwjAUANAMOvj6hwvOQloRXa9JmlxMG0wi0qkUiSBIWqj_j4sf4HSWs2SzPOS0YCa8BBjSBq43tBRbCGRJuAYE-jNJBcK3IaIFbCTUKhonoXIetHd3ajREoyBgrdZs_uzfU9r8XLFtpaIwuzQOXZrG_pFy-nQXX_Ky4PzEj8UB9_-tL8IgLyE
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
DocumentTitleAlternate 고품질 SiC 단결정 및 이의 성장방법
ExternalDocumentID KR20210080715A
GroupedDBID EVB
ID FETCH-epo_espacenet_KR20210080715A3
IEDL.DBID EVB
IngestDate Fri Jul 19 15:23:09 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
Korean
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_KR20210080715A3
Notes Application Number: KR20190172313
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210701&DB=EPODOC&CC=KR&NR=20210080715A
ParticipantIDs epo_espacenet_KR20210080715A
PublicationCentury 2000
PublicationDate 20210701
PublicationDateYYYYMMDD 2021-07-01
PublicationDate_xml – month: 07
  year: 2021
  text: 20210701
  day: 01
PublicationDecade 2020
PublicationYear 2021
RelatedCompanies RESEARCH INSTITUTE OF INDUSTRIAL SCIENCE & TECHNOLOGY
POSCO
RelatedCompanies_xml – name: RESEARCH INSTITUTE OF INDUSTRIAL SCIENCE & TECHNOLOGY
– name: POSCO
Score 3.296075
Snippet The present disclosure relates to a method for growing SiC single crystals which comprises: a step of positioning seeds in a reactor; a first step of raising...
SourceID epo
SourceType Open Access Repository
SubjectTerms AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUSPOLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE
APPARATUS THEREFOR
CHEMISTRY
CRYSTAL GROWTH
METALLURGY
PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITHDEFINED STRUCTURE
REFINING BY ZONE-MELTING OF MATERIAL
SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITHDEFINED STRUCTURE
SINGLE-CRYSTAL-GROWTH
UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL ORUNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL
Title SiC HIGH QUALITY SILICON CARBIDE CRYSTAL AND METHOD FOR GROWING THE SAME
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210701&DB=EPODOC&locale=&CC=KR&NR=20210080715A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfR1dT8Iw8IJo1DdFDSqaJhreiDA2Jw_EjK7QCdvINhWeyLqtCdEAkRn_vrcByhNvba-5XC65r95HAe6TSGhKXoojpVpTo0ZYC5WsEkBX4lhGTVGPs4yu7TzyV_VlpI0K8LnphcnnhP7kwxFRoiKU9zTX14v_Rywzr61cPogpHs2fu0HbrK6jY4xfdIyNzU6bDV3TpVVK232v6ngrGHpHekMz9mAfHWk9kwf21sn6UhbbRqV7AgdDxDdLT6HwMS_BEd38vVaCQ3ud8sblWvqWZ8D9KSXc6nGCfujACsbEtwYWdR1CDQ9VLiPUG_uBMSCGYxKbBdw1CUZ5pOe575bTIwFnxDdsdg53XRZQXkOSJn8cmPS9bfqbF1CczWdJGYjQE60VSk2oaqg2FLyQZMOdWlKvyych40uo7MJ0tRt8DcfZdlWdWoFi-vWd3KANTsVtzrpfBnODVA
link.rule.ids 230,309,783,888,25576,76876
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LT8JAEJ4gGvGmqEFF3UTDjQiltXIgpmwXttIHaavCiXT7SIgGiNT4950WUE7cNjubyWSSb2dm57EA93EoFCkvxUkSuS6HzaAeSFklgCpFURK2RCPKMrqW_chf5ZeRMirA56YXJp8T-pMPR0REhYj3NL-vF_-PWHpeW7l8EFPcmj_3_I5eW0fHGL-oGBvr3Q4bOrpDa5R2Bm7Ndlc09I7UpqLtwT462WqGB_bWzfpSFttGpXcMB0PkN0tPoPAxL0OJbv5eK8OhtU5543KNvuUpcG9KCTf6nKAfahr-mHiGaVDHJlRz8cplhLpjz9dMotk6sZjPHZ1glEf6rvNu2H3ic0Y8zWJncNdjPuV1FGnyp4HJwN2Wv3UOxdl8FleACDVW2kGiCFkO5KaEB-JsuFM7URvJk0iiC6ju4nS5m3wLJe5b5sQ07MEVHGWkVaVqFYrp13d8jfY4FTe5Gn8BW4KGRw
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=SiC+HIGH+QUALITY+SILICON+CARBIDE+CRYSTAL+AND+METHOD+FOR+GROWING+THE+SAME&rft.inventor=SEO+HAN+SEOK&rft.inventor=KIM+JANG+YUL&rft.inventor=EUN+TAI+HEE&rft.inventor=CHUN+MYONG+CHUEL&rft.inventor=YEO+IM+GYU&rft.inventor=LEE+SEUNG+SEOK&rft.date=2021-07-01&rft.externalDBID=A&rft.externalDocID=KR20210080715A