TEST TRAY FOR HANDLER TO SUPPORT TEST OF ELECTRONIC DEVICES

The present invention relates to a test tray for a handler which supports testing of electronic components. According to the present invention, the test tray for a handler which supports the testing of electronic components narrows width to prevent interference with an interface board of a tester in...

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Bibliographic Details
Main Author JEONG JAE HONG
Format Patent
LanguageEnglish
Korean
Published 22.06.2021
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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Summary:The present invention relates to a test tray for a handler which supports testing of electronic components. According to the present invention, the test tray for a handler which supports the testing of electronic components narrows width to prevent interference with an interface board of a tester in some parts of an outer frame, so that a test can be performed normally regardless of specification of the interface board. According to the present invention, even if the specification of the interface board is changed, the existing handler can be used as it is, thereby reducing operating costs. 본 발명은 전자부품의 테스트를 지원하는 핸들러용 테스트트레이에 관한 것이다. 본 발명에 따른 전자부품의 테스트를 지원하는 핸들러용 테스트트레이는 외곽틀의 일부 부위에서 테스터의 인터페이스보드와의 간섭을 방지하기 위해 그 폭을 좁게 함으로써 인터페이스보드의 사향과 관계없이 정상적으로 테스트가 이루어질 수 있도록 한다. 본 발명에 따르면 인터페이스보드의 사양이 바뀌더라도 기존의 핸들러를 그대로 사용할 수 있어서 운용비용을 절감할 수 있는 효과가 있다.
Bibliography:Application Number: KR20190166105