Method for manufacturing semiconductor device
The present invention relates to a method for manufacturing a semiconductor device. More particularly, the present invention relates to a method for manufacturing a semiconductor device comprising: providing a metal precursor on a substrate to form a preliminary film; and providing a reactant and a...
Saved in:
Main Authors | , , , |
---|---|
Format | Patent |
Language | English Korean |
Published |
17.06.2021
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | The present invention relates to a method for manufacturing a semiconductor device. More particularly, the present invention relates to a method for manufacturing a semiconductor device comprising: providing a metal precursor on a substrate to form a preliminary film; and providing a reactant and a co-reactant as a nitrogen source on the preliminary film to form a metal nitride film. The co-reactant is an organo-metallic compound.
본 발명은 반도체 소자의 제조 방법에 관한 것으로, 보다 상세하게는, 기판 상에 금속 전구체를 제공하여, 예비막을 형성하는 것; 및 상기 예비막 상에 질소 소스인 반응물 및 공반응물을 제공하여, 금속 질화막을 형성하는 것을 포함한다. 상기 공반응물은 유기 금속 화합물이다. |
---|---|
Bibliography: | Application Number: KR20200115974 |