SYSTEM FOR DERIVING ELECTRICAL CHARACTERISTICS AND NON-TRANSITORY COMPUTER-READABLE MEDIUM

An objective of the present invention is to provide a system for deriving electrical characteristics of a device formed on a sample. To achieve the objective, according to the present invention, the system comprises an image acquisition tool and a computer system having one or more processors and co...

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Bibliographic Details
Main Authors KIMIZUKA HEITA, TSUNO NATSUKI
Format Patent
LanguageEnglish
Korean
Published 03.02.2021
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Summary:An objective of the present invention is to provide a system for deriving electrical characteristics of a device formed on a sample. To achieve the objective, according to the present invention, the system comprises an image acquisition tool and a computer system having one or more processors and configured to communicate with the image acquisition tool. Proposed is the system performing the following steps of: (S1903) receiving, from the image acquisition tool, information on two or more features of a specific pattern included in a plurality of images acquired by at least two different image acquisition conditions; and (S1904) referencing the corresponding information with the information relating to the two or more features extracted from at least two or more pieces of image data acquired by the at least two image acquisition conditions of the image acquisition tool and information related to electrical characteristics of an element formed on a sample, and thus (S1905) extracting the electrical characteristics. (과제) 본 개시는, 시료 위에 형성된 소자의 전기 특성을 평가 가능한 시스템의 제공을 목적으로 한다. (해결 수단) 상기 목적을 달성하기 위해, 화상 취득 툴과, 1 이상의 프로세서를 갖고, 상기 화상 취득 툴과 통신 가능하게 구성된 컴퓨터 시스템을 포함하는 시스템으로서, 화상 취득 툴로부터, 적어도 2개의 서로 다른 화상 취득 조건에 의해 취득된 복수의 화상에 포함되는 특정 패턴의 2 이상의 특징에 관한 정보를 수취하고(S1903), 당해 정보를, 화상 취득 툴의 적어도 2개의 화상 취득 조건에 의해 얻어진 적어도 2 이상의 화상 데이터로부터 추출되는 2 이상의 특징에 관한 정보와, 시료 위에 형성된 소자의 전기 특성과의 관련 정보에 참조(S1904)함으로써, 전기 특성을 도출하는(S1905) 시스템을 제안한다.
Bibliography:Application Number: KR20200062050